TEIXEIRA PORTELA, A. C.; BRITO, Éder S. de; DAMASCENO TOMAZELLA, V. L.; RIBEIRO DINIZ, C. A.; FERREIRA, P. H. Reliability of repairable systems with Non-Central Gamma frailty. Brazilian Journal of Biometrics, [S. l.], v. 42, n. 2, p. 182–201, 2024. DOI: 10.28951/bjb.v42i2.697. Disponível em: http://www.biometria.ufla.br/index.php/BBJ/article/view/697. Acesso em: 15 jun. 2024.